English French German Japanese Chinese

CLASS

Code:

0112/2///61987#ABA858

Version:

002

Revision:

02

IRDI:

0112/2///61987#ABA858#002

Preferred name:

Bypass/measuring chamber

Synonymous name:


Coded name:


Short name:


Definition:

fitting comprising a chamber that creates an environment where a liquid level is measured

Note:


Remark:


Definition source:


Drawing:


Class type:

ITEM_CLASS

Applicable documents:


Class value assignment:


Requisity of properties:


Superclass:

0112/2///61987#ABA856

Higher level classes:

0112/2///61987#ABA845 - Measuring instrument component
0112/2///61987#ABV000 - Characterization
0112/2///61987#ABA000 - Equipment for industrial-process automation

Classifying DET:


Properties:

0112/2///61987#ABF873 - reference to Device LOP for bypass/measuring chamber

Properties tree:



Inherited properties:

0112/2///61987#ABP396 - reference to General Aspect LOP

SuperBlocks:


Is case of:


Imported properties:


Instance sharable:

true

Status level:

Standard

Is deprecated:


Published in:

IEC 61987

Published by:

IEC

Proposal date:

2023-11-22

Version initiation date:

2013-08-27

Version release date:

2018-03-20

Revision release date:

2023-11-22

Obsolete date:


Responsible Committee:

IEC/SC 65E

Change request ID:

C00146




CLASSE

Code:

0112/2///61987#ABA858

Version:

002

Révision:

02

IRDI:

0112/2///61987#ABA858#002

Nom préféré:

Chambre de mesure

Nom synonyme:


Nom codé:


Nom court:


Définition:

adaptateur comprenant une chambre qui crée un environnement où un niveau de liquide est mesuré

Note:


Remarque:


Traducteur:

Mr. W. Hartmann

Version de traduction:

0

Date de traduction:

2014-12-27

Source de définition:


Dessin:


Class type:

ITEM_CLASS

Applicable documents:


Class value assignment:


Requisity of properties:


Superclasse:

0112/2///61987#ABA856

Classes supérieures:

0112/2///61987#ABA845 - Composant d'instrument de mesure
0112/2///61987#ABV000 - Caractérisation
0112/2///61987#ABA000 - Équipement d'automatisation des procès industriels

DET de classification:


Propriétés:

0112/2///61987#ABF873 - reference to Device LOP for bypass/measuring chamber

Propriétés:



Propriétés héritées:

0112/2///61987#ABP396 - reference to General Aspect LOP

Is case of:


Imported properties:


Instance sharable:

true

Statut:

Standard

Is deprecated:


Publié dans:

IEC 61987

Publié par:

IEC

Date de proposition:

2023-11-22

Version, date d'initialisation:

2013-08-27

Version, date de publication:

2018-03-20

Revision release date:

2023-11-22

Date d'obsolescence:


Responsible Committee:

IEC/SC 65E

Change request ID:

C00146




KLASSE

Code:

0112/2///61987#ABA858

Version:

002

Revision:

02

IRDI:

0112/2///61987#ABA858#002

Bevorzugter Name:

Bypass/Messkammer

Synonym:


Code:


Kurzbezeichnung:


Definition:

Formstück mit einer Kammer, die eine Umgebung schafft, in der der Füllstand einer Flüssigkeit gemessen wird

Notiz:


Bemerkung:


Übersetzer:

Mr. W. Hartmann

Übersetzung, Revision:

0

Übersetzung, Revisionsdatum:

2014-12-27

Quelle der Definition:


Zeichnung:


Class type:

ITEM_CLASS

Applicable documents:


Class value assignment:


Requisity of properties:


Oberbegriff:

0112/2///61987#ABA856

Übergeordnete Klassen:

0112/2///61987#ABA845 - Messgerätekomponente
0112/2///61987#ABV000 - Charakterisierung
0112/2///61987#ABA000 - Einrichtung für die Automatisierung industrieller Prozesse

Klassifizierendes Datenelement:


Merkmale:

0112/2///61987#ABF873 - reference to Device LOP for bypass/measuring chamber

Merkmale:



Übernommene Merkmale:

0112/2///61987#ABP396 - reference to General Aspect LOP

Is case of:


Imported properties:


Instance sharable:

true

Status:

Standard

Is deprecated:


Veröffentlicht in:

IEC 61987

Veröffentlicht von:

IEC

Datum des Vorschlags:

2023-11-22

Version, Veranlassungsdatum:

2013-08-27

Version, Freigabedatum:

2018-03-20

Revision release date:

2023-11-22

Gestrichen seit:


Responsible Committee:

IEC/SC 65E

Change request ID:

C00146




分類(クラス)

識別コード:

0112/2///61987#ABA858

改訂版:

002

修正刷:

02

IRDI:

0112/2///61987#ABA858#002

推奨名:


別名:


コード化された名称:


略称:


定義:


注記:


備考:


翻訳者:


翻訳第 m 版:


翻訳版発行日:


定義出典:


図:


Class type:

ITEM_CLASS

Applicable documents:


Class value assignment:


Requisity of properties:


上位分類:

0112/2///61987#ABA856

上位クラス:

0112/2///61987#ABA845 - Measuring instrument component
0112/2///61987#ABV000 - Characterization
0112/2///61987#ABA000 - Equipment for industrial-process automation

分類プロパティ:


プロパティ:

0112/2///61987#ABF873 - reference to Device LOP for bypass/measuring chamber

プロパティ:



継承プロパティ:

0112/2///61987#ABP396 - reference to General Aspect LOP

Is case of:


Imported properties:


Instance sharable:

true

状態:

標準

Is deprecated:


公開:

IEC 61987

公開者:

IEC

提案日時:

2023-11-22

初版作成日:

2013-08-27

改訂版公開日:

2018-03-20

Revision release date:

2023-11-22

廃用期日:


Responsible Committee:

IEC/SC 65E

Change request ID:

C00146





代码:

0112/2///61987#ABA858

版本号:

002

修订号:

02

IRDI:

0112/2///61987#ABA858#002

推荐名:


同义名:


代码名:


短名:


定义:


注释:


备注:


Translator (to be translated in Chinese):


Translation revison (to be translated in Chinese):


Translation revision date (to be translated in Chinese):


定义来源:


图:


类类型:

ITEM_CLASS

适用文档:


Class value assignment:


特性的必要性:


超类:

0112/2///61987#ABA856

上层类:

0112/2///61987#ABA845 - Measuring instrument component
0112/2///61987#ABV000 - Characterization
0112/2///61987#ABA000 - Equipment for industrial-process automation

分类DET:


特性:

0112/2///61987#ABF873 - reference to Device LOP for bypass/measuring chamber

特性树:



Inherited properties:

0112/2///61987#ABP396 - reference to General Aspect LOP

Is case of:


输入特性:


Instance sharable:

true

状态级别:

Standard (to be translated)

Is deprecated:


发布:

IEC 61987

发布者:

IEC

提议日期:

2023-11-22

版本生成日期:

2013-08-27

版本发布日期:

2018-03-20

修订发布日期:

2023-11-22

废止日期:


负责委员会:

IEC/SC 65E

变更请求号:

C00146




Version history
Historique
Historie
版改訂履歴:
版本历史:

002-02 (2023-11-22 15:56:07 by BATCH 00000816) standard


.....

Web page created 2024-04-28
Copyright © 2024 IEC, Geneva, Switzerland. All rights reserved