IEC - Common Data Dictionary (CDD)

	VALUE LIST
Code:	0112/2///61360_4#ASA012
Version:	001
Revision:	02
IRDI:	0112/2///61360_4#ASA012#001
Preferred name:
Enumerated list of terms: Enumerated list of terms:	0112/2///61360_4#AUA040 - burn-in (100%) 0112/2///61360_4#AUA041 - special KGD test, wafer level 0112/2///61360_4#AUA042 - lot-acceptance testing 0112/2///61360_4#AUA043 - scanning electron microscope 0112/2///61360_4#AUA044 - radiation 0112/2///61360_4#AUA045 - special stress tests at wafer probe 0112/2///61360_4#AUA046 - visual inspection 0112/2///61360_4#AUA047 - no data available 0112/2///61360_4#AUA040 - burn-in (100%) 0112/2///61360_4#AUA041 - special KGD test, wafer level 0112/2///61360_4#AUA042 - lot-acceptance testing 0112/2///61360_4#AUA043 - scanning electron microscope 0112/2///61360_4#AUA044 - radiation .....
Enumeration code list:	B, K, L, M, R, S, V, X
Applicable properties:	0112/2///61360_4#AAD134 - process options
Synonymous name:
Short name:
Definition:
Definition source:
Value source:
Note:
Remark:
Definition class:	0112/2///61360_4#AAA302
Status level:	Standard
Version initiation date:
Version release date:
Revision release date:	2011-08-29
Responsible Committee:
Change request ID:	C00030
Version history: Version history:	001-02 (2011-08-29 18:05:59 by BATCH 00000722) standard

	VALEUR
Code:	0112/2///61360_4#ASA012
Version:	001
Révision:	02
IRDI:	0112/2///61360_4#ASA012#001
Nom préféré:
Liste des termes de l'énumération (to be validated): Liste des termes de l'énumération (to be validated):	0112/2///61360_4#AUA040 - burn-in (100%) 0112/2///61360_4#AUA041 - special KGD test, wafer level 0112/2///61360_4#AUA042 - lot-acceptance testing 0112/2///61360_4#AUA043 - scanning electron microscope 0112/2///61360_4#AUA044 - radiation 0112/2///61360_4#AUA045 - special stress tests at wafer probe 0112/2///61360_4#AUA046 - visual inspection 0112/2///61360_4#AUA047 - no data available 0112/2///61360_4#AUA040 - burn-in (100%) 0112/2///61360_4#AUA041 - special KGD test, wafer level 0112/2///61360_4#AUA042 - lot-acceptance testing 0112/2///61360_4#AUA043 - scanning electron microscope 0112/2///61360_4#AUA044 - radiation .....
Liste des codes de l'énumération (to be validated):	B, K, L, M, R, S, V, X
Applicable properties:	0112/2///61360_4#AAD134 - process options
Nom synonyme:
Nom court:
Définition:
Source de définition:
Source de valeur:
Note:
Remarque:
Definition class:
Statut:	Standard
Version, date d'initialisation:
Version, date de publication:
Revision release date:	2011-08-29
Traducteur:
Version de traduction:
Date de traduction:
Responsible Committee:
Change request ID:	C00030
Historique: Historique:	001-02 (2011-08-29 18:05:59 by BATCH 00000722) standard

	WERT
Code:	0112/2///61360_4#ASA012
Version:	001
Revision:	02
IRDI:	0112/2///61360_4#ASA012#001
Bevorzugter Name:
Nummerierte Liste der Begriffe (to be validated): Nummerierte Liste der Begriffe (to be validated):	0112/2///61360_4#AUA040 - burn-in (100%) 0112/2///61360_4#AUA041 - special KGD test, wafer level 0112/2///61360_4#AUA042 - lot-acceptance testing 0112/2///61360_4#AUA043 - scanning electron microscope 0112/2///61360_4#AUA044 - radiation 0112/2///61360_4#AUA045 - special stress tests at wafer probe 0112/2///61360_4#AUA046 - visual inspection 0112/2///61360_4#AUA047 - no data available 0112/2///61360_4#AUA040 - burn-in (100%) 0112/2///61360_4#AUA041 - special KGD test, wafer level 0112/2///61360_4#AUA042 - lot-acceptance testing 0112/2///61360_4#AUA043 - scanning electron microscope 0112/2///61360_4#AUA044 - radiation .....
Aufzählung Codeliste (to be validated):	B, K, L, M, R, S, V, X
Applicable properties:	0112/2///61360_4#AAD134 - process options
Synonym:
Kurzbezeichnung:
Definition:
Quelle der Definition:
Wert, Quelle:
Notiz:
Bemerkung:
Definition class:	0112/2///61360_4#AAA302
Status:	Standard
Version, Veranlassungsdatum:
Version, Freigabedatum:
Revision release date:	2011-08-29
Übersetzer:
Übersetzung, Revision:
Übersetzung, Revisionsdatum:
Responsible Committee:
Change request ID:	C00030
Historie: Historie:	001-02 (2011-08-29 18:05:59 by BATCH 00000722) standard

	選択肢
識別コード:	0112/2///61360_4#ASA012
改訂版:	001
修正刷:	02
IRDI:	0112/2///61360_4#ASA012#001
推奨名:
用語の列挙リスト(to be validated): 用語の列挙リスト(to be validated):	0112/2///61360_4#AUA040 - burn-in (100%) 0112/2///61360_4#AUA041 - special KGD test, wafer level 0112/2///61360_4#AUA042 - lot-acceptance testing 0112/2///61360_4#AUA043 - scanning electron microscope 0112/2///61360_4#AUA044 - radiation 0112/2///61360_4#AUA045 - special stress tests at wafer probe 0112/2///61360_4#AUA046 - visual inspection 0112/2///61360_4#AUA047 - no data available 0112/2///61360_4#AUA040 - burn-in (100%) 0112/2///61360_4#AUA041 - special KGD test, wafer level 0112/2///61360_4#AUA042 - lot-acceptance testing 0112/2///61360_4#AUA043 - scanning electron microscope 0112/2///61360_4#AUA044 - radiation .....
列挙型のコード一覧 (to be validated):	B, K, L, M, R, S, V, X
Applicable properties:	0112/2///61360_4#AAD134 - process options
別名:
略称:
定義:
定義出典:
値出典:
注記:
備考:
Definition class:	0112/2///61360_4#AAA302
状態:	標準
初版作成日:
改訂版公開日:
Revision release date:	2011-08-29
翻訳者:
翻訳第　m 版:
翻訳版発行日:
Responsible Committee:
Change request ID:	C00030
版改訂履歴: 版改訂履歴:	001-02 (2011-08-29 18:05:59 by BATCH 00000722) standard

	VALUE LIST
代码:	0112/2///61360_4#ASA012
版本号:	001
修订号:	02
IRDI:	0112/2///61360_4#ASA012#001
推荐名:
Enumerated list of terms: Enumerated list of terms:	0112/2///61360_4#AUA040 - burn-in (100%) 0112/2///61360_4#AUA041 - special KGD test, wafer level 0112/2///61360_4#AUA042 - lot-acceptance testing 0112/2///61360_4#AUA043 - scanning electron microscope 0112/2///61360_4#AUA044 - radiation 0112/2///61360_4#AUA045 - special stress tests at wafer probe 0112/2///61360_4#AUA046 - visual inspection 0112/2///61360_4#AUA047 - no data available 0112/2///61360_4#AUA040 - burn-in (100%) 0112/2///61360_4#AUA041 - special KGD test, wafer level 0112/2///61360_4#AUA042 - lot-acceptance testing 0112/2///61360_4#AUA043 - scanning electron microscope 0112/2///61360_4#AUA044 - radiation .....
Enumeration code list:	B, K, L, M, R, S, V, X
Applicable properties:	0112/2///61360_4#AAD134 - process options
同义名:
短名:
定义:
定义来源:
值来源:
注释:
备注:
定义类:	0112/2///61360_4#AAA302
状态级别:	Standard (to be translated)
版本生成日期:
版本发布日期:
修订发布日期:	2011-08-29
Translator (to be translated in Chinese):
Translation revison (to be translated in Chinese):
Translation revision date (to be translated in Chinese):
负责委员会:
变更请求号:	C00030
版本历史: 版本历史:	001-02 (2011-08-29 18:05:59 by BATCH 00000722) standard